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From: Robert Baer on 27 Apr 2010 04:46 John Larkin wrote: > On Mon, 26 Apr 2010 00:44:13 -0700, Robert Baer > <robertbaer(a)localnet.com> wrote: > >> GreenXenon wrote: >>> On Apr 15, 5:31 pm, whit3rd <whit...(a)gmail.com> wrote in >>> http://groups.google.com/group/sci.electronics.design/msg/afed810b124c3b77 >>> : >>> >>> >>>> On Apr 15, 2:15 pm, GreenXenon <glucege...(a)gmail.com> wrote: >>>> >>> >>>>> Can similar data recovery be performed on volatile RAM chips even >>>>> after the power is offed. >>> >>>> Similar, no. Recovery, yes. The volatility has a time decay constant >>>> of a second or so, and it takes a long, temperature-dependent, delay >>>> after power-off to thermalize the information to nonexistence. >>> >>> Let's say that after the power supply is cut-off from the volatile RAM >>> chip, the RAM chip is heated to the hottest it can get without >>> suffering any physical damage. Will this speed up the rate at which >>> data is lost? What is the maximum physically-safe temperature to erase >>> all info? What would be the best way of heating the chips? >> Nominal MIL-spec temp range is -55C to +125C so one can safely use >> +125C for this operation. >> That said, most semiconductors easily tolerate 150C. >> Remember, ions, static charges, and chemical reactions speed up by a >> factor of two for every 10C increase in temperature. > > Ions speed up? Static charges? Explain? > > John > > > Oh yes! Put a charge in a CMOS device or even take those trapped under / inside and measure the capacitance as a function of voltage. Bake at 250 with one polarity present then re-measure after cooling (voltage present while cooling always), bake with opposite polarity present then re-measure after cooling (voltage present while cooling always), bake with a short and re-measure. With the data, one can calculate amount of positive charges and amount of negative charges trapped. Over sufficient time and temp, a goodly amount of those charges do dissipate. |