Prev: Translate Error: ngd build 604
Next: CFP with Extended Deadline of Mar. 21, 2010: The 2010 International Conference on Grid Computing and Applications (GCA'10), USA, July 2010
From: Tier Logic on 11 Mar 2010 02:41 On Mar 10, 10:54 pm, Kim Enkovaara <kim.enkova...(a)iki.fi> wrote: > -jg wrote: > > Doing the stacking at the wafer/fab level saves handling, but you are > > exposed to testing issues. > > > Until you have finished the two-process flows, you really have > > nothing to test. So yields are ?? > > I don't see it impossible to test the cmos wafer before the tft process, > depending on how they constructed the topmost metal layer. For example > they could have some dummy bump pads there for power, and then internal > bist with certain coverage built with the lower metal layers. > > FPGAs are quite easy in terms of yield, because you can have redundant > structures for yield improvement (in fabric and in memories). > > --Kim I don't want to marketeer too much here because this is a technical site. All I can tell you is that our FPGAs will save you money because our die size is reduced. If you convert it to our ASIC you will save even more money for a minimal NRE. ( zero NRE for early access customers). I did want to clear up any questions on our testing methodolgies. Our FPGA is tested the same as any other SRAM based FPGA is tested. The only difference is that our configuration SRAM is above the CMOS base layer in a second active layer resulting in a smaller die size. We test it to 100% functional FPGA test patterns in the same way any other SRAM-based FPGA is tested. There is no need to test until the complete FPGA is done being processed. The TierASIC is tested with a scan-based ASIC methodology we added to the silicon. The customer is not required to generate any test vectors. Once you lock your design, you simply send us the bitstream and we auto generate the test vectors for your ASIC. We create one M9 hard mask and stop there. I do believe that the significant cost reduction in moving from our FPGA to our ASIC will make it a popular choice. You also get the advantages of no possibility of configuration SEUs, bitstream security, no config rom needed, instant on, and customer logos. The yield of the ASIC increases over the yield of the FPGA because the ASIC is only tested to that customer pattern. Also, the timing is identical to the FPGA version which means zero conversion risk. We can deliver ASIC samples in about 4 weeks. Jeff
From: John_H on 11 Mar 2010 09:12 On Mar 11, 1:45 am, Kim Enkovaara <kim.enkova...(a)iki.fi> wrote: > > big accuounts have no problem with registration, NDAs etc. > > --Kim That's a false assumption. Even big accounts have individual engineers who thrive on free flow of information to <b>understand the technologies to consider in the first place</b>. There is a tendency not to look into every company proclaiming new and revolutionary technology if the information isn't readily available. Perhaps some engineers are interested in spending the time and hassle to dig into all the little wannabe startups but there are few that warrant the all-out risk associated with a new single-source supplier with no guaranteed future unless the technology is truly superb. If the risk is extreme, why look at it in the first place unless it's a casual 15 minutes of web perusal to understand the claims?
From: John_H on 11 Mar 2010 09:32 On Mar 11, 2:41 am, Tier Logic <jeff.ka...(a)gmail.com> wrote: > On Mar 10, 10:54 pm, Kim Enkovaara <kim.enkova...(a)iki.fi> wrote: > > > > > -jg wrote: > > > Doing the stacking at the wafer/fab level saves handling, but you are > > > exposed to testing issues. > > > > Until you have finished the two-process flows, you really have > > > nothing to test. So yields are ?? > > > I don't see it impossible to test the cmos wafer before the tft process, > > depending on how they constructed the topmost metal layer. For example > > they could have some dummy bump pads there for power, and then internal > > bist with certain coverage built with the lower metal layers. > > > FPGAs are quite easy in terms of yield, because you can have redundant > > structures for yield improvement (in fabric and in memories). > > > --Kim > > I don't want to marketeer too much here because this is a technical > site. All I can tell you is that our FPGAs will save you money because > our die size is reduced. If you convert it to our ASIC you will save > even more money for a minimal NRE. ( zero NRE for early access > customers). > > I did want to clear up any questions on our testing methodolgies. > > Our FPGA is tested the same as any other SRAM based FPGA is tested. > The only difference is that our configuration SRAM is above the CMOS > base layer in a second active layer resulting in a smaller die size. > We test it to 100% functional FPGA test patterns in the same way any > other SRAM-based FPGA is tested. There is no need to test until the > complete FPGA is done being processed. > > The TierASIC is tested with a scan-based ASIC methodology we added to > the silicon. The customer is not required to generate any test > vectors. Once you lock your design, you simply send us the bitstream > and we auto generate the test vectors for your ASIC. We create one M9 > hard mask and stop there. I do believe that the significant cost > reduction in moving from our FPGA to our ASIC will make it a popular > choice. You also get the advantages of no possibility of configuration > SEUs, bitstream security, no config rom needed, instant on, and > customer logos. > > The yield of the ASIC increases over the yield of the FPGA because the > ASIC is only tested to that customer pattern. Also, the timing is > identical to the FPGA version which means zero conversion risk. We can > deliver ASIC samples in about 4 weeks. > > Jeff Thanks for returning to talk further about the issues brought up on this newsgroup. I wish you success in achieving noticeable market share. While I can understand the savings brought from removing the configuration memories and associated die size, I still envision the FPGA-like overhead as being significant since routing is such a large portion of typical FPGA resources. The routing won't go away, only the configuration memory. The result is still not an ASIC-killer unless the price-point for (for instance) 40nm TierASIC devices can compare at a price point with a couple steps behind in the process curve. If a turn on a 90nm or 120nm ASIC can produce similar cost points in per-piece costs to a TierASIC on the tighter process, there might be something here. We all understand the issues of NRE and timing. But it's so much smoke and mirrors at this point it's hard for the big customers who have ASIC suppliers or the medium customers who need to *work* to get access to information to really consider the technology. If the TierASIC information becomes more transparent to demonstrate the true "technical" savings versus the ASIC approach rather than "marketing" savings, TierASIC won't disturb the engineers responsible for *considering* the technology in the first place. Marketing people tend not to sway engineers with marketing; they tend to influence with the technology proposition and real associated cost points. In my mind, it's a question of whether there's a desire to market to the select few who aren't concerned about risk versus reward within their company framework or to the many who may see how large the reward is and how low the risk is in the end. I want better solutions to succeed. *I* won't pursue vague promises but I'll consider real information. Big difference.
From: austin on 11 Mar 2010 11:23 John, Correct, you got it. I was always looking for the best solution when I did my stint as a design engineer from 1978 to 1998 in telecom. The last thing on my list was the vendor: there were many things ahead of that (although, the vendor, and their history is important, too). So, in the telecoms business: here was my order of importance: 1. Price 2. Price 3. Price. 4. Power: (yes, even so long ago, telecoms were 'green') 5. Availability: (if it had the advantages above, I would pre-order, stock, and do whatever needed to get those advantages) 6. Performance (I would make do with less performance if I had the advantages above) 7. Reliability: (I would burn in, re-test, operate at a lower temperature, if I could get an inexpensive part to meet my 20 year life requirement) 8. Vendor: (support, applications notes, demo boards, free IP, code, tools -- I would tolerate a lot missing here to meet the first three goals) The bottom line was if I could make an equivalent, or better product, for a lower cost than my competition, I would get the contract. I once lost a million dollar contract to MCI being just $0.01 more expensive on a $125 circuit pack than my competition, so it was (and still is) a rough real world out there. So, for those who used to do what I did, log onto their website, give them the required information, download the information, and get going. Austin
From: Nico Coesel on 11 Mar 2010 12:59
John_H <newsgroup(a)johnhandwork.com> wrote: >On Mar 10, 11:46=A0am, Tier Logic <jeff.ka...(a)gmail.com> wrote: >> The world's first 3D FPGA has arrived! We have a very compelling and >> cost effective solution. >> >> Come check it out folks.www.tierlogic.com >> >> Jeff > >Sad. > >I have a passing interest in anything proclaiming itself "new" and >"revolutionary" but I won't bother to register to get more >information. > >I *might* have the next $1M+ design but it will go to standard FPGAs >because I can't find out about the promising technology on a casual >basis. I agree. We use a 1000+ ARM controllers per year. Luminary required registration so they didn't even make it on the short list. -- Failure does not prove something is impossible, failure simply indicates you are not using the right tools... nico(a)nctdevpuntnl (punt=.) -------------------------------------------------------------- |